Introduction to Advanced System-On-Chip Test Design and Optimization

By Erik Larsson

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Book Overview

Testing Concepts.- Design Flow.- Design for Test.- Boundary Scan.- SOC Design for Testability.- System Modeling.- Test Conflicts.- Test Power Dissipation.- Test Access Mechanism.- Test Scheduling.- SOC Test Applications.- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.- An Integrated Framework for the Design and Optimization of SOC Test Solutions.- Efficient Test Solutions for Core-Based Designs.- Core Selection in the SOC Test Design-Flow.- Defect-Aware Test Scheduling.- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint.

Format:Paperback

Language:English

ISBN:1441952691

ISBN13:9781441952691

Release Date:February 2011

Publisher:Springer

Length:388 Pages

Weight:1.26 lbs.

Dimensions:0.8" x 6.1" x 9.2"

Related Subjects

Engineering Technology

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Introduction to Advanced System-On-Chip Test Design and Optimization

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