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Paperback High Quality Test Pattern Generation and Boolean Satisfiability Book
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ISBN: 1489988475

ISBN13: 9781489988478

High Quality Test Pattern Generation and Boolean Satisfiability

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Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.

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Format: Paperback

Condition: New

$129.99
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Computers Computers & Technology Engineering Technology

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